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User Access

CENEM enables the access to high-end instrumentation in the fields of Electron Microscopy, Cryo-TEM, Scattering Methods and Scanning Probes for internal and external users.

The regulations, contact persons and booking systems for the individual methods can be found in the respective submenus Electron MicroscopyCryo-TEMScattering Methods Scanning Probes Atom Probe and X-ray Microscopy .