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Scanning Probes

User access to the Scanning Probes Facility

If you want to obtain access as a user to one of the instruments of the scanning probes division please contact one of the corresponding supervisors listed below.

Instrument Supervisors

Bruker AFM Dimension 3100

Dr.-Ing. Benoit Merle
Tel: 09131 85 27473
Email: benoit.merle@fau.de

Keysight Technologies Nanoindenter G 200

Dr.-Ing. Benoit Merle
Tel: 09131 85 27473
Email: benoit.merle@fau.de

VISITEC Large Chamber SEM

Dr.-Ing. Heinz Werner Höppel
Tel: 09131 85 27503
Email: hwe.hoeppel@fau.de

&

Dipl.-Ing. Christian Krechel
Tel: 0911/65078 65009
Email: christian.krechel@fau.de