Scanning Probes

User access to the Scanning Probes Facility

If you want to obtain access as a user to one of the instruments of the scanning probes division please contact one of the corresponding supervisors listed below.

The regulations of the Scanning Probes User Facility, the access to the microscopes as well as the expenses for the users are defined in the users’ regulation.

Instrument Supervisors

Bruker AFM Dimension 3100

Dr.-Ing. Benoit Merle
Tel: 09131 85 27473
Email: benoit.merle@fau.de

Keysight Technologies Nanoindenter G 200

Dr.-Ing. Benoit Merle
Tel: 09131 85 27473
Email: benoit.merle@fau.de

VISITEC Large Chamber SEM

Dr.-Ing. Heinz Werner Höppel
Tel: 09131 85 27503
Email: hwe.hoeppel@fau.de

&

Dipl.-Ing. Christian Krechel
Tel: 0911/65078 65009
Email: christian.krechel@fau.de