The Center for Nanoanalysis and Electron Microscopy (CENEM) is a facility featuring cutting-edge instrumentation, techniques and expertise required for microscopic and analytical characterization of materials and devices down to the atomic scale. CENEM focuses on several complementary analysis techniques, which closely work together: Electron Microscopy, X-ray Microscopy, Cryo-TEM, Scattering Methods, Scanning Probes and Atom Probe Microscopy.

The PhD defence of CENEM's research unit GRK1896 member Mr. Peter Schweizer took place on 18. Sep. 2019. With his beautiful work of “Manipulation of individual defects in 2D and layered materials”, he has been awarded the title Dr.-Ing. with the top overall grade "summa cum laude" His PhD work ha...

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