Home

The Center for Nanoanalysis and Electron Microscopy (CENEM) is a facility featuring cutting-edge instrumentation, techniques and expertise required for microscopic and analytical characterization of materials and devices down to the atomic scale. CENEM focuses on several complementary analysis techniques, which closely work together: Electron Microscopy, X-ray Microscopy, Cryo-TEM, Scattering Methods, Scanning Probes and Atom Probe Microscopy.
What looks like the microscopist’s version of the search for the needle in the haystack is in reality a scanning electron microscopy (SEM) image depicting several overlapping silver nanowires (AgNWs). These wires exhibit a diameter of roughly 35 nm and a length of several microns. The shown AgNW net...
We recently published the manuscript titled "3D analysis of equally X-ray attenuating mineralogical phases utilizing a correlative tomographic workflow across multiple length scales" in the journal Powder Technology demonstrating an interdisciplinary collaboration between the IMN and the groups of P...
This image reminds us on confetti, which fits to the carnival season!
Every color represents a specific in-plane orientation of the nano-crystallites. This orientation mapping of AlN crystallites was acquired with 4D-STEM, an advanced technique collecting the electron diffraction patterns at each p...
Even though there is not enough snow surrounding us in nature, we at least have an image that reminds us of snowflakes.
These “snowflakes” are dendritic silver patches synthesized in the group of Prof. Robin Klupp Taylor, Institute of Particle Technology. The image was acquired using the scanning t...
We wish you a Merry Christmas and a Happy New Year!
We are looking forward to sharing our calendar 2023 with you online. Every month a fascinating microscopy image will be revealed reflecting the research of CENEM and IMN.
The cover picture shows an electron diffraction image of TiS2, a layere...