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The Center for Nanoanalysis and Electron Microscopy (CENEM) is a facility featuring cutting-edge instrumentation, techniques and expertise required for microscopic and analytical characterization of materials and devices down to the atomic scale. CENEM focuses on several complementary analysis techniques, which closely work together: Electron Microscopy, X-ray Microscopy, Cryo-TEM, Scattering Methods, Scanning Probes and Atom Probe Microscopy.

The article “Effect of size and shape on the elastic modulus of metal nanowires” by Lilian Vogl, Peter Schweizer, Gunther Richter and Erdmann Spiecker has recently been published in MRS Advances. Congratulations, Lili and Peter! The CENEM/IMN researchers make use of the resonance vibration of metal ...