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Welcome to the Center for Nanoanalysis and Electron Microscopy (CENEM)
The Center for Nanoanalysis and Electron Microscopy (CENEM) is a facility featuring cutting-edge instrumentation, techniques and expertise required for microscopic and analytical characterization of materials and devices down to the atomic scale. CENEM focuses on several complementary analysis techniques, which closely work together: Electron Microscopy, X-ray Microscopy, Cryo-TEM, Scattering Methods, Scanning Probes and Atom Probe Microscopy.
A research team from the Department of Materials Science at FAU and CENEM has made a significant step forward in understanding how platinum single atoms (Pt SAs) behave under thermal conditions on titanium dioxide (TiO₂) surfaces—crucial knowledge for advancing photocatalytic hydrogen generation. Th...
From April 1–4, 2025, over 30 members of the Institute of Micro and Nanostructure Research (IMN) gathered in the picturesque village of Kleedorf for the annual IMN retreat. Organized with great care and energy by Benni, Irene, Lena, and Jenny, the retreat brought together all PostDocs, PhD candidate...
IMN/CENEM researchers recently published their study on the “Influence of substrate polarity on thermal stability, grain growth and atomic interface structure of Au thin films on ZnO surfaces” in Acta Materialia (https://doi.org/10.1016/j.actamat.2024.120531). The work was carried out in close colla...
IMN/CENEM is proud to announce the publication of a collaborative study entitled "Microscopic mechanism of the L1₂–D0₁₉ phase transformation in a Co-base single crystal superalloy" in Acta Materialia! This study offers novel insights into the atomic-level processes governing an often-observed phase ...
IMN/CENEM is delighted to announce that a new high-resolution SEM/STEM instrument is enhancing the electron microscopy facility and expanding CENEM’s research capabilities.
The microscope, a GEMINI SEM 560 from Carl Zeiss Microscopy, was funded within the framework of a DFG proposal for major res...
