CENEM enables the access to high-end instrumentation in the fields of Electron Microscopy, Cryo-TEM, Scattering Methods and Scanning Probes for users of CENEM’s user facility.
The regulations, contact persons and booking systems for the individual methods can be found in the respective submenus Electron Microscopy, Cryo-TEM, Scattering Methods Scanning Probes Atom Probe and X-ray Microscopy .
If you have a request regarding possible cooperations, service measurements or microscope instructions for the electron microscopy and X-ray imaging facilities of CENEM, please use the following request form.
CENEM – electron microscopy and X-ray imaging facilities
Cooperation, service and device instruction request form