Scanning Probes
Scanning Probes Facility
Keysight Technologies Nanoindenter G 200
- Continuous stiffness mode
- XP and DCM-1 heads
- Nanovision stage (AFM imaging with indenter)
- High temperature cell (up to 250°C)
- Optical microscope
- Lateral force sensors
- Maximum load 200 mN
- Load resolution 50 nN
- Depth resolution <0.01 nm
- Positioning accuracy 1 µm (with nanovision stage 2 nm)
VISITEC Large Chamber SEM
- Warm field emission gun
- Two SE detectors, quadrant BSE detector, EBSD, EDX, Everhart-Thornley detector
- Integrated servo-hydraulic testing machine with maximum testing force of 100 kN
- Heating equipment for mechanical testing up to 350 °C
- Chamber size 2 m³
- Samples up to 700 mm in diameter, 600 mm in height and 300 kg
- 5 axes positioning system for electro-optical components and detectors