User access to the Electron Microscopy Facility

CENEM enables the access to high-end electron microscopes for users of CENEM’s user facility. Three transmission electron microscopes (TEM) and one focused ion beam (FIB) instrument are available to perform investigations of a variety of materials and devices using conventional, high-resolution, analytical as well as advanced techniques of electron microscopy.

The aberration corrected Titan Themis³ 300 TEM as well as the SEM/FIB Helios NanoLab 660 are only operated by staff of CENEM and the Institute of Micro- and Nanostructure Research, but can be used in cooperation and service order.

The CM30 TEM can be operated directly by users of CENEM’s user facility.

The aberration corrected Spectra 200 TEM is in an internal commissioning phase and will be soon available for users of CENEM’s user facility.

The regulations of the Electron Microscopy User Facility, the access to the microscopes as well as the expenses for the users are defined in the users’ regulation.

Requests

Please use the CENEM request form for any type of cooperation, service or microscope instruction request.
-> Request form

The booking system

-> show

Supervisors of the electron microscopes

Spectra 200

Dr. Tadahiro Yokosawa
Cauerstr. 3
91058 Erlangen
Email: tadahiro.yokosawa@fau.de

CM30

Titan Themis³ 300

FIB Helios NanoLab 660

X-ray protection officer

Prof. Dr. Erdmann Spiecker
Tel: 09131 85 70400

Dr. Benjamin Apeleo Zubiri
Tel: 09131 85 70394

Dr. Stefanie Rechberger
Tel: 09131 85 70393

Dr. Johannes Will
Tel: 09131 85 70393

Dipl.-Chem. Robert Branscheid
Tel: 09131 85 70382